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FPGA Defect Tolerance: Impact of Granularity

Anthony J. Yu, Guy G. Lemieux. FPGA Defect Tolerance: Impact of Granularity. In Gordon J. Brebner, Samarjit Chakraborty, Weng-Fai Wong, editors, Proceedings of the 2005 IEEE International Conference on Field-Programmable Technology, FPT 2005, 11-14 December 2005, Singagore. pages 189-196, IEEE, 2005.

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