Chaowen Yu, Wei Li, Sudhakar M. Reddy, Irith Pomeranz. An Improved Markov Source Design for Scan BIST. In 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece. pages 106-110, IEEE Computer Society, 2003. [doi]
@inproceedings{YuLRP03,
title = {An Improved Markov Source Design for Scan BIST},
author = {Chaowen Yu and Wei Li and Sudhakar M. Reddy and Irith Pomeranz},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/iolts/2003/1968/00/19680106abs.htm},
tags = {source-to-source, Markov, design, open-source},
researchr = {https://researchr.org/publication/YuLRP03},
cites = {0},
citedby = {0},
pages = {106-110},
booktitle = {9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece},
publisher = {IEEE Computer Society},
isbn = {0-7695-1968-7},
}