The following publications are possibly variants of this publication:
- Pseudo Random Patterns Using Markov Sources for Scan BISTNadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz. itc 2002: 1013-1021 [doi]
- Scan BIST Targeting Transition Faults Using a Markov SourceHangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy. isqed 2004: 497-502 [doi]
- A scan BIST generation method using a markov source and partial bit-fixingWei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz. dac 2003: 554-559 [doi]
- Evolutionary Optimization of Markov Sources for Pseudo Random Scan BISTIlia Polian, Bernd Becker, Sudhakar M. Reddy. date 2003: 11184-11185 [doi]
- Markov source based test length optimized SCAN-BIST architectureAftab Farooqi, Richard O. Gale, Sudhakar M. Reddy, Brian Nutter, Chris Monico. isqed 2009: 708-713 [doi]