Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz. A scan BIST generation method using a markov source and partial bit-fixing. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 554-559, ACM, 2003. [doi]
Abstract is missing.