A scan BIST generation method using a markov source and partial bit-fixing - researchr publication authors

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Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz. A scan BIST generation method using a markov source and partial bit-fixing. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 554-559, ACM, 2003. [doi]

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