Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz. A scan BIST generation method using a markov source and partial bit-fixing. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 554-559, ACM, 2003. [doi]
@inproceedings{LiYRP03,
title = {A scan BIST generation method using a markov source and partial bit-fixing},
author = {Wei Li and Chaowen Yu and Sudhakar M. Reddy and Irith Pomeranz},
year = {2003},
doi = {10.1145/775832.775974},
url = {http://doi.acm.org/10.1145/775832.775974},
tags = {source-to-source, Markov, open-source},
researchr = {https://researchr.org/publication/LiYRP03},
cites = {0},
citedby = {0},
pages = {554-559},
booktitle = {Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003},
publisher = {ACM},
isbn = {1-58113-688-9},
}