Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz. A Partitioning Technique for Identification of Error-Capturing Scan Cells in Scan-BIST. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 37-42, IEEE Computer Society, 2006. [doi]
Abstract is missing.