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Remembrance of Transistors Past: Compact Model Parameter Extraction Using Bayesian Inference and Incomplete New Measurements

Li Yu, Sharad Saxena, Christopher Hess, Abe Elfadel, Dimitri A. Antoniadis, Duane S. Boning. Remembrance of Transistors Past: Compact Model Parameter Extraction Using Bayesian Inference and Incomplete New Measurements. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-6, ACM, 2014. [doi]

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