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Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding

Haiying Yuan, Zijian Ju, Xun Sun, Kun Guo, Xiuyu Wang. Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding. J. Electronic Testing, 32(5):639-647, 2016. [doi]

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Haiying Yuan

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Zijian Ju

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Xun Sun

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Kun Guo

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Xiuyu Wang

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