Haiying Yuan, Zijian Ju, Xun Sun, Kun Guo, Xiuyu Wang. Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding. J. Electronic Testing, 32(5):639-647, 2016. [doi]
@article{YuanJSGW16,
title = {Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding},
author = {Haiying Yuan and Zijian Ju and Xun Sun and Kun Guo and Xiuyu Wang},
year = {2016},
doi = {10.1007/s10836-016-5595-z},
url = {http://dx.doi.org/10.1007/s10836-016-5595-z},
researchr = {https://researchr.org/publication/YuanJSGW16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {5},
pages = {639-647},
}