Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding

Haiying Yuan, Zijian Ju, Xun Sun, Kun Guo, Xiuyu Wang. Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding. J. Electronic Testing, 32(5):639-647, 2016. [doi]

Abstract

Abstract is missing.