MBIST Supported Multi Step Trim for Reliable eMRAM Sensing - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda. MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-5, IEEE, 2020. [doi]

This author has not been identified. Look up 'Jongsin Yun' in GoogleThis author has not been identified. Look up 'Benoit Nadeau-Dostie' in GoogleThis author has not been identified. Look up 'Martin Keim' in GoogleThis author has not been identified. Look up 'Lori Schramm' in GoogleThis author has not been identified. Look up 'Cyrille Dray' in GoogleThis author has not been identified. Look up 'El Mehdi Boujamaa' in GoogleThis author has not been identified. Look up 'Khushal Gelda' in Google

runs on WebDSL