Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda. MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{YunNKSDBG20,
title = {MBIST Supported Multi Step Trim for Reliable eMRAM Sensing},
author = {Jongsin Yun and Benoit Nadeau-Dostie and Martin Keim and Lori Schramm and Cyrille Dray and El Mehdi Boujamaa and Khushal Gelda},
year = {2020},
doi = {10.1109/ITC44778.2020.9325218},
url = {https://doi.org/10.1109/ITC44778.2020.9325218},
researchr = {https://researchr.org/publication/YunNKSDBG20},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9113-3},
}