Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda. MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.