D. Zander, C. Petit, F. Saigné, A. Meinertzhagen. High field stress at and above room temperature in 2.3 nm thick oxides. Microelectronics Reliability, 41(7):1023-1026, 2001. [doi]
@article{ZanderPSM01,
title = {High field stress at and above room temperature in 2.3 nm thick oxides},
author = {D. Zander and C. Petit and F. Saigné and A. Meinertzhagen},
year = {2001},
doi = {10.1016/S0026-2714(01)00062-2},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00062-2},
tags = {C++},
researchr = {https://researchr.org/publication/ZanderPSM01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {7},
pages = {1023-1026},
}