D. Zander, F. Saigné, A. Meinertzhagen, C. Petit. Contribution of oxide traps on defect creation and LVSILC conduction in ultra thin gate oxide devices. Microelectronics Reliability, 43(9-11):1489-1493, 2003. [doi]
@article{ZanderSMP03,
title = {Contribution of oxide traps on defect creation and LVSILC conduction in ultra thin gate oxide devices},
author = {D. Zander and F. Saigné and A. Meinertzhagen and C. Petit},
year = {2003},
doi = {10.1016/S0026-2714(03)00264-6},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00264-6},
tags = {C++},
researchr = {https://researchr.org/publication/ZanderSMP03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {9-11},
pages = {1489-1493},
}