Cost Optimum Embedded DRAM Design by Yield Analysis - researchr publication authors

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Youhei Zenda, Koji Nakamae, Hiromu Fujioka. Cost Optimum Embedded DRAM Design by Yield Analysis. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 20, IEEE Computer Society, 2003. [doi]

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