Youhei Zenda, Koji Nakamae, Hiromu Fujioka. Cost Optimum Embedded DRAM Design by Yield Analysis. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 20, IEEE Computer Society, 2003. [doi]
@inproceedings{ZendaNF03,
title = {Cost Optimum Embedded DRAM Design by Yield Analysis},
author = {Youhei Zenda and Koji Nakamae and Hiromu Fujioka},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/mtdt/2003/2004/00/20040020abs.htm},
tags = {analysis, design},
researchr = {https://researchr.org/publication/ZendaNF03},
cites = {0},
citedby = {0},
pages = {20},
booktitle = {11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2004-9},
}