C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations

Wei Zeng, Hengliang Zhu, Xuan Zeng, Dian Zhou, Rueywen Liu, Xin Li. C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(6):899-912, 2017. [doi]

Authors

Wei Zeng

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Hengliang Zhu

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Xuan Zeng

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Dian Zhou

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Rueywen Liu

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Xin Li

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