Wei Zeng, Hengliang Zhu, Xuan Zeng, Dian Zhou, Rueywen Liu, Xin Li. C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(6):899-912, 2017. [doi]
@article{ZengZZZLL17,
title = {C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations},
author = {Wei Zeng and Hengliang Zhu and Xuan Zeng and Dian Zhou and Rueywen Liu and Xin Li},
year = {2017},
doi = {10.1109/TCAD.2016.2613927},
url = {https://doi.org/10.1109/TCAD.2016.2613927},
researchr = {https://researchr.org/publication/ZengZZZLL17},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {36},
number = {6},
pages = {899-912},
}