Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification

Rouying Zhan, Haigang Feng, Qiong Wu, Xiaokang Guan, Guang Chen, Haolu Xie, Albert Z. Wang. Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification. In Masaharu Imai, editor, Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004. pages 710-712, IEEE, 2004. [doi]

Abstract

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