Zhiwen Zhang, Qian Gong, Yuan Cao, Cheng Yin, Enyi Yao, Yanhua Liu, Yongqing Pan. Detecting LED Chip Surface Defects with Modified Faster R-CNN. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 268-269, IEEE, 2021. [doi]
@inproceedings{ZhangGCYYLP21,
title = {Detecting LED Chip Surface Defects with Modified Faster R-CNN},
author = {Zhiwen Zhang and Qian Gong and Yuan Cao and Cheng Yin and Enyi Yao and Yanhua Liu and Yongqing Pan},
year = {2021},
doi = {10.1109/ISOCC53507.2021.9613949},
url = {https://doi.org/10.1109/ISOCC53507.2021.9613949},
researchr = {https://researchr.org/publication/ZhangGCYYLP21},
cites = {0},
citedby = {0},
pages = {268-269},
booktitle = {18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021},
publisher = {IEEE},
isbn = {978-1-6654-0174-6},
}