The following publications are possibly variants of this publication:
- Chip Surface Defect Recognition based on Improved Faster R-CNNChengxia Ma, Yuan Chao, JunJie Zhu, Yaqian Wang, Wenhui Liu, Zhenhua Han. m2vip 2022: 1-6 [doi]
- An Improved Faster R-CNN for Steel Surface Defect DetectionXiancong Shi, Sike Zhou, Yichun Tai, Jinzhong Wang, Shoucang Wu, Jinrong Liu, Kun Xu, Tao Peng, Zhijiang Zhang. mmsp 2022: 1-5 [doi]
- Detection of Steel Surface Defect Based on Faster R-CNN and FPNTianping Yin, Jie Yang. iccai 2021: 15-20 [doi]
- Mobile Phone Surface Defect Detection Based on Improved Faster R-CNNTao Wang, Can Zhang, Runwei Ding, Ge Yang. icpr 2021: 9371-9377 [doi]
- Fast γ Photon Imaging for Inner Surface Defects DetectingMin Yao, Guangdong Luo, Min Zhao 0011, Ruipeng Guo, Jian Liu. sensors, 21(23):8134, 2021. [doi]