A BIST scheme for testing and repair of multi-mode power switches - researchr publication authors

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Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty. A BIST scheme for testing and repair of multi-mode power switches. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 115-120, IEEE, 2011. [doi]

This author has not been identified. Look up 'Zhaobo Zhang' in GoogleThis author has not been identified. Look up 'Xrysovalantis Kavousianos' in GoogleThis author has not been identified. Look up 'Yiorgos Tsiatouhas' in GoogleThis author has not been identified. Look up 'Krishnendu Chakrabarty' in Google

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