Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty. A BIST scheme for testing and repair of multi-mode power switches. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 115-120, IEEE, 2011. [doi]
@inproceedings{ZhangKTC11,
title = {A BIST scheme for testing and repair of multi-mode power switches},
author = {Zhaobo Zhang and Xrysovalantis Kavousianos and Yiorgos Tsiatouhas and Krishnendu Chakrabarty},
year = {2011},
doi = {10.1109/IOLTS.2011.5993821},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993821},
tags = {testing},
researchr = {https://researchr.org/publication/ZhangKTC11},
cites = {0},
citedby = {0},
pages = {115-120},
booktitle = {17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece},
publisher = {IEEE},
isbn = {978-1-4577-1053-7},
}