Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty. A BIST scheme for testing and repair of multi-mode power switches. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 115-120, IEEE, 2011. [doi]
Abstract is missing.