Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips - researchr publication authors

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Ling Zhang, Zipeng Li, Krishnendu Chakrabarty. Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-10, IEEE, 2018. [doi]

This author has not been identified. Look up 'Ling Zhang' in GoogleThis author has not been identified. Look up 'Zipeng Li' in GoogleThis author has not been identified. Look up 'Krishnendu Chakrabarty' in Google

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