Ling Zhang, Zipeng Li, Krishnendu Chakrabarty. Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-10, IEEE, 2018. [doi]
@inproceedings{ZhangLC18-9,
title = {Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips},
author = {Ling Zhang and Zipeng Li and Krishnendu Chakrabarty},
year = {2018},
doi = {10.1109/TEST.2018.8624847},
url = {https://doi.org/10.1109/TEST.2018.8624847},
researchr = {https://researchr.org/publication/ZhangLC18-9},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018},
publisher = {IEEE},
isbn = {978-1-5386-8382-8},
}