Transfer and Detection of Single Electrons Using Metal-Oxide-Semiconductor Field-Effect Transistors

Wancheng Zhang, Katsuhiko Nishiguchi, Yukinori Ono, Akira Fujiwara, Hiroshi Yamaguchi, Hiroshi Inokawa, Yasuo Takahashi, Nan-Jian Wu. Transfer and Detection of Single Electrons Using Metal-Oxide-Semiconductor Field-Effect Transistors. IEICE Transactions, 90-C(5):943-948, 2007. [doi]

@article{ZhangNOFYITW07,
  title = {Transfer and Detection of Single Electrons Using Metal-Oxide-Semiconductor Field-Effect Transistors},
  author = {Wancheng Zhang and Katsuhiko Nishiguchi and Yukinori Ono and Akira Fujiwara and Hiroshi Yamaguchi and Hiroshi Inokawa and Yasuo Takahashi and Nan-Jian Wu},
  year = {2007},
  doi = {10.1093/ietele/e90-c.5.943},
  url = {http://dx.doi.org/10.1093/ietele/e90-c.5.943},
  researchr = {https://researchr.org/publication/ZhangNOFYITW07},
  cites = {0},
  citedby = {0},
  journal = {IEICE Transactions},
  volume = {90-C},
  number = {5},
  pages = {943-948},
}