Scan Tests with Multiple Fault Activation Cycles for Delay Faults - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski. Scan Tests with Multiple Fault Activation Cycles for Delay Faults. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 343-348, IEEE Computer Society, 2006. [doi]

This author has not been identified. Look up 'Zhuo Zhang' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in GoogleThis author has not been identified. Look up 'Irith Pomeranz' in GoogleThis author has not been identified. Look up 'Xijiang Lin' in GoogleThis author has not been identified. Look up 'Janusz Rajski' in Google

runs on WebDSL