Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski. Scan Tests with Multiple Fault Activation Cycles for Delay Faults. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 343-348, IEEE Computer Society, 2006. [doi]
Abstract is missing.