The following publications are possibly variants of this publication:
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- Fixed-State Tests for Delay Faults in Scan DesignsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 19(1):142-146, 2011. [doi]
- Locating faults using multiple spectra-specific modelsKai Yu, Mengxiang Lin, Qing Gao, Hui Zhang, Xiangyu Zhang. SAC 2011: 1404-1410 [doi]
- Effectiveness of scan-based delay fault tests in diagnosis of transition faultsIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 1(5):537-545, 2007. [doi]
- Scan-Based Delay Fault Tests for Diagnosis of Transition FaultsIrith Pomeranz, Sudhakar M. Reddy. dft 2006: 419-427 [doi]