Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz. Multiple fault activation cycle tests for transistor stuck-open faults. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 821, IEEE, 2010. [doi]
Abstract is missing.