Sai Zhang, Naresh R. Shanbhag. Probabilistic Error Models for machine learning kernels implemented on stochastic nanoscale fabrics. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 481-486, IEEE, 2016. [doi]
@inproceedings{ZhangS16-10,
title = {Probabilistic Error Models for machine learning kernels implemented on stochastic nanoscale fabrics},
author = {Sai Zhang and Naresh R. Shanbhag},
year = {2016},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459358},
researchr = {https://researchr.org/publication/ZhangS16-10},
cites = {0},
citedby = {0},
pages = {481-486},
booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
editor = {Luca Fanucci and Jürgen Teich},
publisher = {IEEE},
isbn = {978-3-9815-3707-9},
}