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Probabilistic Error Models for machine learning kernels implemented on stochastic nanoscale fabrics

Sai Zhang, Naresh R. Shanbhag. Probabilistic Error Models for machine learning kernels implemented on stochastic nanoscale fabrics. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 481-486, IEEE, 2016. [doi]

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