Sai Zhang, Naresh R. Shanbhag. Probabilistic Error Models for machine learning kernels implemented on stochastic nanoscale fabrics. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 481-486, IEEE, 2016. [doi]
Abstract is missing.