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Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs

Wenqi Zhang, Tzuo-Li Wang, Yan-hua Huang, Tsu-Ting Cheng, Shih-Yao Chen, Yi-Ying Li, Chun-Hsiang Hsu, Chih-Jui Lai, Wen-Kuan Yeh, Yi-lin Yang. Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs. Microelectronics Reliability, 67:89-93, 2016. [doi]

Authors

Wenqi Zhang

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Tzuo-Li Wang

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Yan-hua Huang

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Tsu-Ting Cheng

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Shih-Yao Chen

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Yi-Ying Li

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Chun-Hsiang Hsu

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Chih-Jui Lai

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Wen-Kuan Yeh

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Yi-lin Yang

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