Current based PUF exploiting random variations in SRAM cells - researchr publication authors

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Fengchao Zhang, Shuo Yang, Jim Plusquellic, Swarup Bhunia. Current based PUF exploiting random variations in SRAM cells. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 277-280, IEEE, 2016. [doi]

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