Fengchao Zhang, Shuo Yang, Jim Plusquellic, Swarup Bhunia. Current based PUF exploiting random variations in SRAM cells. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 277-280, IEEE, 2016. [doi]
@inproceedings{ZhangYPB16,
title = {Current based PUF exploiting random variations in SRAM cells},
author = {Fengchao Zhang and Shuo Yang and Jim Plusquellic and Swarup Bhunia},
year = {2016},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459321},
researchr = {https://researchr.org/publication/ZhangYPB16},
cites = {0},
citedby = {0},
pages = {277-280},
booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
editor = {Luca Fanucci and Jürgen Teich},
publisher = {IEEE},
isbn = {978-3-9815-3707-9},
}