Total-ionizing-dose effects and reliability of carbon nanotube FET devices

Cher Xuan Zhang, En-xia Zhang, Daniel M. Fleetwood, Michael L. Alles, Ronald D. Schrimpf, Chris Rutherglen, Kosmas Galatsis. Total-ionizing-dose effects and reliability of carbon nanotube FET devices. Microelectronics Reliability, 54(11):2355-2359, 2014. [doi]

Abstract

Abstract is missing.