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Highly Reliable 40nm Embedded Dual-Interface-Switching RRAM Technology for Display Driver IC Applications

L. Zhao, Z. Chen, D. Manea, S. Li, J. Li, Y. Zhu, Z. Sui, Z. Lu. Highly Reliable 40nm Embedded Dual-Interface-Switching RRAM Technology for Display Driver IC Applications. In IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022. pages 316-317, IEEE, 2022. [doi]

Authors

L. Zhao

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Z. Chen

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D. Manea

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S. Li

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J. Li

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Y. Zhu

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Z. Sui

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Z. Lu

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