L. Zhao, Z. Chen, D. Manea, S. Li, J. Li, Y. Zhu, Z. Sui, Z. Lu. Highly Reliable 40nm Embedded Dual-Interface-Switching RRAM Technology for Display Driver IC Applications. In IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022. pages 316-317, IEEE, 2022. [doi]
Abstract is missing.