Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors - researchr publication authors

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Peng Zhao, Lei Cao, Fan Zhang, Haoqing Xu, Weizhuo Gan, Qingzhu Zhang, Zhaohao Zhang, Jiaxin Yao, Guoliang Tian, Kun Luo, Zhenhua Wu, Huaxiang Yin. Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors. Microelectronics Journal, 141:105970, November 2023. [doi]

This author has not been identified. Look up 'Peng Zhao' in GoogleThis author has not been identified. Look up 'Lei Cao' in GoogleThis author has not been identified. Look up 'Fan Zhang' in GoogleThis author has not been identified. Look up 'Haoqing Xu' in GoogleThis author has not been identified. Look up 'Weizhuo Gan' in GoogleThis author has not been identified. Look up 'Qingzhu Zhang' in GoogleThis author has not been identified. Look up 'Zhaohao Zhang' in GoogleThis author has not been identified. Look up 'Jiaxin Yao' in GoogleThis author has not been identified. Look up 'Guoliang Tian' in GoogleThis author has not been identified. Look up 'Kun Luo' in GoogleThis author has not been identified. Look up 'Zhenhua Wu' in GoogleThis author has not been identified. Look up 'Huaxiang Yin' in Google

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