Performance-effective compaction of standard cell library for edge-triggered latches utilizing 0.5 micron technology - researchr publication authors

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Chun Zhao, W. Pan, C. Z. Zhao, Ka Lok Man, J. Choi, J. Chang. Performance-effective compaction of standard cell library for edge-triggered latches utilizing 0.5 micron technology. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 313-316, IEEE, 2011. [doi]

This author has not been identified. Look up 'Chun Zhao' in GoogleThis author has not been identified. Look up 'W. Pan' in GoogleThis author has not been identified. Look up 'C. Z. Zhao' in GoogleThis author has not been identified. Look up 'Ka Lok Man' in GoogleThis author has not been identified. It may be one of the following persons:

Jonghyun Choi

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