Performance-effective compaction of standard cell library for edge-triggered latches utilizing 0.5 micron technology

Chun Zhao, W. Pan, C. Z. Zhao, Ka Lok Man, J. Choi, J. Chang. Performance-effective compaction of standard cell library for edge-triggered latches utilizing 0.5 micron technology. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 313-316, IEEE, 2011. [doi]

@inproceedings{ZhaoPZMCC11,
  title = {Performance-effective compaction of standard cell library for edge-triggered latches utilizing 0.5 micron technology},
  author = {Chun Zhao and W. Pan and C. Z. Zhao and Ka Lok Man and J. Choi and J. Chang},
  year = {2011},
  doi = {10.1109/ISOCC.2011.6138773},
  url = {http://dx.doi.org/10.1109/ISOCC.2011.6138773},
  researchr = {https://researchr.org/publication/ZhaoPZMCC11},
  cites = {0},
  citedby = {0},
  pages = {313-316},
  booktitle = {International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011},
  publisher = {IEEE},
  isbn = {978-1-4577-0709-4},
}