Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing

Dan Zhao, Shambhu J. Upadhyaya. Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(6):956-965, 2005. [doi]

Authors

Dan Zhao

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Shambhu J. Upadhyaya

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