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Dan Zhao, Shambhu J. Upadhyaya. Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(6):956-965, 2005. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Power Constrained Test Scheduling with Dynamically Varied TAMDan Zhao, Shambhu J. Upadhyaya. vts 2003: 273-278 [doi] Adaptive Test Scheduling in SoC s by Dynamic PartitioningDan Zhao, Shambhu J. Upadhyaya. dft 2002: 334-344 [doi]
The following publications are possibly variants of this publication: