Dan Zhao, Shambhu J. Upadhyaya. Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(6):956-965, 2005. [doi]
@article{ZhaoU05,
title = {Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing},
author = {Dan Zhao and Shambhu J. Upadhyaya},
year = {2005},
doi = {10.1109/TCAD.2005.847893},
url = {http://dx.doi.org/10.1109/TCAD.2005.847893},
tags = {testing, partitioning},
researchr = {https://researchr.org/publication/ZhaoU05},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {24},
number = {6},
pages = {956-965},
}