Hao Zheng, Chris J. Myers, David Walter, Scott Little, Tomohiro Yoneda. Verification of timed circuits with failure-directed abstractions. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(3):403-412, 2006. [doi]
@article{ZhengMWLY06,
title = {Verification of timed circuits with failure-directed abstractions},
author = {Hao Zheng and Chris J. Myers and David Walter and Scott Little and Tomohiro Yoneda},
year = {2006},
doi = {10.1109/TCAD.2005.854638},
url = {http://dx.doi.org/10.1109/TCAD.2005.854638},
tags = {abstraction},
researchr = {https://researchr.org/publication/ZhengMWLY06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {3},
pages = {403-412},
}