Jun Zhou, Senthil Jayapal, Ben Busze, Li Huang, Jan Stuyt. A 40 nm inverse-narrow-width-effect-aware sub-threshold standard cell library. In Leon Stok, Nikil D. Dutt, Soha Hassoun, editors, Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011. pages 441-446, ACM, 2011. [doi]
Abstract is missing.